8–12 Sept 2025
Europe/London timezone

Influence of microwave parameters on the afterglow beam

11 Sept 2025, 11:15
1h 45m
Poster Fundamental processes in ion sources and plasmas Poster Session

Speaker

立轩 李

Description

Heavy ion synchrotron accelerators rely on intense pulsed beams of highly charged ions. The production of these pulsed beams from an electron cyclotron resonance (ECR) ion source is predominantly achieved through the afterglow mode. However, the influence of microwave parameters on the characteristics of afterglow beams in high-frequency, high-power and large plasma-volume ion sources remains underexplored. Recently, a series of experiments were conducted with a third-generation superconducting ECR ion source. The effects of key microwave parameters, including the power level and pulse length of the secondary microwave source, as well as the RF-off time of the primary microwave radiation, on xenon afterglow beam currents are systematically examined. The experimental results and conclusions derived from the data are presented in this article.

Primary authors

Hongwei Zhao (Institute of Modern Physics (IMP), Chinese Academy of Sciences (CAS)) Jibo Li (Institute of Modern Physics (IMP), Chinese Academy of Sciences (CAS)) Liangting Sun (Institute of Modern Physics (IMP), Chinese Academy of Sciences (CAS)) Olli Tarvainen (STFC) Wang Lu (Institute of Modern Physics (IMP), Chinese Academy of Sciences (CAS)) Xinyu Wang (Institute of Modern Physics (IMP), Chinese Academy of Sciences (CAS)) 立轩 李

Presentation materials